Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
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چکیده
منابع مشابه
Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components.
Surface topography and light scattering were measured on 15 samples ranging from those having smooth surfaces to others with ground surfaces. The measurement techniques included an atomic force microscope, mechanical and optical profilers, confocal laser scanning microscope, angle-resolved scattering, and total scattering. The samples included polished and ground fused silica, silicon carbide, ...
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ژورنال
عنوان ژورنال: Applied Optics
سال: 2002
ISSN: 0003-6935,1539-4522
DOI: 10.1364/ao.41.000154